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BS 5348-2-1989 肉类和肉类制品取样方法.第2部分:微生物检测试样制备

作者:标准资料网 时间:2024-05-17 21:29:03  浏览:9519   来源:标准资料网
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【英文标准名称】:Methodsforsamplingmeatandmeatproducts-Preparationoftestsamplesformicrobiologicalexamination
【原文标准名称】:肉类和肉类制品取样方法.第2部分:微生物检测试样制备
【标准号】:BS5348-2-1989
【标准状态】:作废
【国别】:英国
【发布日期】:1989-06-30
【实施或试行日期】:1989-06-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:微生物分析;肉制品;试样制备;食品检验;肉;食品;生物分析和试验
【英文主题词】:Agriculturalproducts;Foodproducts;Meat;Meatproducts;Microbiologicalanalysis;Samplingmethods;Specimenpreparation;Testing;Tests
【摘要】:1ThispartofISO3100givesgeneralinstructionsandspecifiesprocedurestobefollowedaftertakingalaboratorysamplefrommeatandmeatproducts,forthepurposeofmicrobiologicalexamination.2Adistinctionismadebetweentreatmentsforthefollow-ingcategoriesofproducts:a)consignmentsorlotsofmeatormeatproductspre-paredorpackedasindividualunitsofanysize(forexamplesausages,vacuum-packedmincedmeat,slicedsausages,cannedcookedham),ormeatinpiecesnotexceeding2kginmass;b)carcasses,cutsofcarcasses,orcuredmeatinpiecesexceeding2kginmass,andmechanicallyseparatedmeatordriedmeat.
【中国标准分类号】:X22
【国际标准分类号】:07_100_30;67_120_10
【页数】:8P;A4
【正文语种】:英语


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【英文标准名称】:StandardGuideforIonizingRadiation(TotalDose)EffectsTestingofSemiconductorDevices
【原文标准名称】:半导体器件电离辐射(总剂量)效应试验的标准指南
【标准号】:ASTMF1892-2006
【标准状态】:现行
【国别】:
【发布日期】:2006
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:双极;电离辐射;微电子学;半导体器件;X射线试验
【英文主题词】:ASIC(applicationspecificintegratedcircuit);bipolar;cobalt60testing;gammaraytests;ionizingradiationtesting;MOS;radiationhardness;semiconductordevices;timedependenteffects;totaldosetesting;X-raytesting
【摘要】:Electroniccircuitsusedinspace,military,andnuclearpowersystemsmaybeexposedtovariouslevelsofionizingradiation.Itisessentialforthedesignandfabricationofsuchcircuitsthattestmethodsbeavailablethatcandeterminethevulnerabilityorhardness(measureofnonvulnerability)ofcomponentstobeusedinsuchsystems.Somemanufacturerscurrentlyaresellingsemiconductorpartswithguaranteedhardnessratings.Useofthisguideprovidesabasisforstandardizedqualificationandacceptancetesting.1.1Thisguidepresentsbackgroundandguidelinesforestablishinganappropriatesequenceoftestsanddataanalysisproceduresfordeterminingtheionizingradiation(totaldose)hardnessofmicroelectronicdevicesfordoseratesbelow300rd(SiO2)/s.Thesetestsandanalysiswillbeappropriatetoassistinthedeterminationoftheabilityofthedevicesundertesttomeetspecifichardnessrequirementsortoevaluatethepartsforuseinarangeofradiationenvironments.1.2Themethodsandguidelinespresentedwillbeapplicabletocharacterization,qualification,andlotacceptanceofsilicon-basedMOSandbipolardiscretedevicesandintegratedcircuits.Theywillbeappropriatefortreatmentoftheeffectsofelectronandphotonirradiation.1.3Thisguideprovidesaframeworkforchoosingatestsequencebasedongeneralcharacteristicsofthepartstobetestedandtheradiationhardnessrequirementsorgoalsfortheseparts.1.4Thisguideprovidesfortradeoffsbetweenminimizingtheconservativenatureofthetestingmethodandminimizingtherequiredtestingeffort.1.5Determinationofaneffectiveandeconomicalhardnesstesttypicallywillrequireseveralkindsofdecisions.Apartialenumerationofthedecisionsthattypicallymustbemadeisasfollows:1.5.1DeterminationoftheNeedtoPerformDeviceCharacterizationForsomecasesitmaybemoreappropriatetoadoptsomekindofworstcasetestingschemethatdoesnotrequiredevicecharacterization.Forothercasesitmaybemosteffectivetodeterminetheeffectofdose-rateontheradiationsensitivityofadevice.Asnecessary,theappropriatelevelofdetailofsuchacharacterizationalsomustbedetermined.1.5.2DeterminationofanEffectiveStrategyforMinimizingtheEffectsofIrradiationDoseRateontheTestResultTheresultsofradiationtestingonsometypesofdevicesarerelativelyinsensitivetothedoserateoftheradiationappliedinthetest.Incontrast,manyMOSdevicesandsomebipolardeviceshaveasignificantsensitivitytodoserate.Severaldifferentstrategiesformanagingthedoseratesensitivityoftestresultswillbediscussed.1.5.3ChoiceofanEffectiveTestMethodologyTheselectionofeffectivetestmethodologieswillbediscussed.1.6LowDoseRequirementsHardnesstestingofMOSandbipolarmicroelectronicdevicesforthepurposeofqualificationorlotacceptanceisnotnecessarywhentherequiredhardnessis100rd(SiO2)orlower.1.7SourcesThisguidewillcovereffectsduetodevicetestingusingirradiationfromphotonsources,suchas60Coirradiators,137Csirradiators,andlowenergy(approximately10keV)X-raysources.Othersourcesoftestradiationsuchaslinacs,VandeGraaffsources,Dymnamitrons,SEMs,andflashX-raysourcesoccasionallyareusedbutareoutsidethescopeofthisguide.1.8Displacementdamageeffectsareoutsidethescopeofthisguide,aswell.1.9ThevaluesstatedinSIunitsaretoberegardedasthestandard.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:40P.;A4
【正文语种】:


基本信息
标准名称:肥皂试验方法 肥皂中水分和挥发物含量的测定 烘箱法
英文名称:Test methods of soaps Determination of moisture and volatile matter content in soaps -- Oven method
中标分类: 轻工、文化与生活用品 >> 日用化工品 >> 牙膏、肥皂、洗涤剂
ICS分类: 化工技术 >> 化工产品
替代情况:替代QB/T 3751-1999
发布部门:中华人民共和国国家发展和改革委员会
发布日期:2003-12-11
实施日期:2004-05-01
首发日期:1900-01-01
作废日期:1900-01-01
提出单位:中国轻工业联合会
归口单位:全国表面活性剂洗涤用品标准化中心
起草单位:国家洗涤用品质量监督检验中心(太原)
起草人:梁红艳
出版社:中国轻工业出版社
出版日期:2004-03-23
页数:4页
书号:155019.2607
适用范围

本标准规定了用烘箱法测定肥皂中的水分和挥发物含量。
本标准适用于测定肥皂在(103士2)℃加热条件下失去的水分以及其他物质,不适用于复合皂。

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所属分类: 轻工 文化与生活用品 日用化工品 牙膏 肥皂 洗涤剂 化工技术 化工产品

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